Method and apparatus for electrothermal relaxation differential spectrometry

Application: non-destructive methods of investigation and analysis of thermal processes in power semiconductor devices: MOS and bipolar transistors, LEDs, heterolasers.

Advantages: easy to analyze performance measurement results of the structure of the thermal resist­ance and profiles of heat fluxes measured in the samples in the form of time spectra.

Key features: the construction of thermal models describing the passage of heat flow on the elements of the device structure, including thermal SPICE models. The output of both differential and dis­crete electrothermal spectra. Calculation of parameters of thermal RC-circuits according to schemes of Cauer and Foster.

Developed: Research and Testing Laboratory of New Constructional Materials, SE «Scientific and Technological Park of BNTU «Polytechnic», Dr. Vladimir Niss, PhD (Cand. of Tech. Sci.).

Tel.: +375 17 296 67 22, fax: +375 17 292 71 83, e-mail: